IEC 62899-503-1:2020 ED1

Printed electronics - Part 503-1: Quality assessment - Test method of displacement current measurement for printed thin-film transistor

Publication date: May 27, 2020

General information

Current stage: 60.60 Effective date: May 27, 2020

Originator: IEC

Owner: TC 119

Type: International Standard

ICS: 29.045 31.080.30

Languages: English

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Status: Published

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Scope

IEC 62899-503-1:2020(E) specifies a test method for displacement current measurement (DCM) for printed thin film transistors (TFTs) or organic thin film transistors (OTFTs).

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PUBLISHED
IEC 62899-503-1:2020 ED1
60.60 Standard published
May 27, 2020

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