Published
Describes profiles and the general structure of contact (stylus) instruments for measuring surface roughness and waviness. Specifies the properties of the instrument which influence profile evaluation. Replaces the first edition of ISO 3274:1975 and ISO 1880:1979.
PUBLISHED
ISO 3274:1996
90.92
Standard to be revised
Mar 13, 2023
Corrected by
ISO 3274:1996/Cor 1:1998
IN_DEVELOPMENT
ISO/DIS 25178-601
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