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ISO/AWI TS 23879

Nanotechnologies — Structural characterization of graphene oxide flakes: thickness and lateral size measurement using AFM and SEM

General information

20.00     Jul 6, 2022

ISO

ISO/TC 229

Technical Specification

Scope

This document describes methods for measuring the lateral size and thickness of graphene oxide (GO) flakes using scanning electron microscopy (SEM) and atomic force microscopy (AFM) respectively, including sample pre-treatments, measurement procedures and data analysis. It is applicable to the characterization of graphene oxide in powder and liquid dispersion forms.

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IN_DEVELOPMENT
ISO/AWI TS 23879
20.00 New project registered in TC/SC work programme
Jul 6, 2022

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