IEC 61967-4:2002 ED1

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions, 1 ohm/150 ohm direct coupling method

Publication date: 27 korr 2006

General information

Current stage: 99.60 Effective date: 16 mar 2021

Next stage: WPUB

Originator: IEC

Owner: TC 47/SC 47A

Type: International Standard

ICS: 31.200

Gjuha: anglisht frëngjisht

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Statusi: Revised

PDF - 30 529 Lekë

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Scope

Specifies a method to measure the conducted electromagnetic emission of integrated circuits by direct RF current measurement with a 1 ohm resistive probe and RF voltage measurement using a 150 ohm coupling network. These methods guarantee a high degree of repeatability and correlation of measurements.
The contents of the corrigendum 1 of June 2017 have been included in this copy.

Life cycle

NOW

IEC 61967-4:2002 ED1
99.60 Withdrawal effective
16 mar 2021

CORRIGENDA / AMENDMENTS

Amended by
IEC 61967-4:2002/AMD1:2006 ED1

Corrected by
IEC 61967-4:2002/COR1:2017 ED1

REVISED BY

PUBLISHED
IEC 61967-4:2021 ED2

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