ISO/AWI 13139

Microbeam analysis — Analytical electron microscopy — The measurement of the dislocation density in thin metals

Scope

This document specifies procedures for the measurement of dislocation density in thin metals by using transmission electron microscope. This document applies to measure the dislocation density lower than 11015m-2. This document applies to analyse the dislocations in a single grain of the thin metals’ specimen with the thickness between tens to hundreds of nanometers.