ISO 6342:1993

Micrographics — Aperture cards — Method of measuring thickness of buildup area

95.99 Withdrawal of Standard Jul 15, 2003

General information

Current stage: 95.99 Effective date: Jul 15, 2003

Originator: ISO

Owner: ISO/TC 171/SC 2

Type: International Standard

ICS: 37.080

Scope

The method specified determines the buildup thickness of the aperture card as the difference between the thickness of the buildup area and the thickness of the card both measured using a micrometer.

Life cycle

NOW

WITHDRAWN
ISO 6342:1993
95.99 Withdrawal of Standard
Jul 15, 2003

REVISED BY

PUBLISHED
ISO 6342:2003

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