ISO 6342:1993

Micrographics — Aperture cards — Method of measuring thickness of buildup area

95.99 Withdrawal of Standard 15 korr 2003

General information

Current stage: 95.99 Effective date: 15 korr 2003

Originator: ISO

Owner: ISO/TC 171/SC 2

Type: International Standard

ICS: 37.080

Scope

The method specified determines the buildup thickness of the aperture card as the difference between the thickness of the buildup area and the thickness of the card both measured using a micrometer.

Life cycle

NOW

WITHDRAWN
ISO 6342:1993
95.99 Withdrawal of Standard
15 korr 2003

REVISED BY

PUBLISHED
ISO 6342:2003

Preview

Only informative sections of projects are publicly available. To view the full content, you will need to members of the committee. If you are a member, please log in to your account by clicking on the "Log in" button.