SSH ISO 6342:2003

Mikrografi – Kartat me dritare – Metoda për matjen e trashësisë së zonës së shtuar

Micrographics — Aperture cards — Method of measuring thickness of buildup area

Publication date: 24 mar 2017

General information

Current stage: 60.60 Effective date: 24 mar 2017

Originator: DPS

Owner: DPS/KT 304

Type: International Standard

ICS: 37.080

Gjuha: anglisht

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Statusi: Publikuar

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PDF and Paper - 3 212 Lekë

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Scope

ISO 6342:2003 specifies a method of measuring the thickness of the buildup area on aperture cards (camera and copy cards) for manufacturing and inspection purposes.

Life cycle

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PUBLISHED
SSH ISO 6342:2003
60.60 Standard published
24 mar 2017

Related project

Adopted from ISO 6342:2003

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