ISO 6342:2003

Micrographics — Aperture cards — Method of measuring thickness of buildup area

Publication date: 15 korr 2003

General information

Current stage: 90.93 Effective date: 12 shk 2021

Originator: ISO

Owner: ISO/TC 171

Type: International Standard

ICS: 37.080

Gjuha: anglisht

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Statusi: Publikuar

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Scope

ISO 6342:2003 specifies a method of measuring the thickness of the buildup area on aperture cards (camera and copy cards) for manufacturing and inspection purposes.

Life cycle

PREVIOUSLY

Revises
ISO 6342:1993

NOW

PUBLISHED
ISO 6342:2003
90.93 Standard confirmed
12 shk 2021

National adoptions

SSH ISO 6342:2003

DPS

Mikrografi – Kartat me dritare – Metoda për matjen e trashësisë së zonës së shtuar

60.60 Standard published

DPS/KT 304 më tepër

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