IEC 62373:2006 ED1

Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)

Publication date: 18 korr 2006

General information

Current stage: 60.60 Effective date: 18 korr 2006

Originator: IEC

Owner: TC 47

Type: International Standard

ICS: 31.080.30

Gjuha: anglisht frëngjisht

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Statusi: Publikuar

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Scope

Provides a test procedure for a bias-temperature (BT) stability test of metal-oxide semiconductor, field-effect transistors (MOSFET)

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PUBLISHED
IEC 62373:2006 ED1
60.60 Standard published
18 korr 2006

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